- 1.The world's highest SE resolution of 0.4 nm at 30 kV is guaranteed.
- 2.Usable magnification of up to 3,000,000x.
- 3。Newly designed CFE GUN provides high brightness and an extremely stable emission current。
- 4.Superior low kV performance for observing beam sensitive materials.
- 5.Next generation Hitachi In-Lens SEM optics allows for routine observation at 1,000,000x.
- 6.Improved vacuum technology that allows for UHV levels for reduced sample contamination.
- 7。Highly engineered instrument enclosure featuring both superior strength and stability to allow for high resolution imaging in a broad range of environmental conditions。
- 8.Newly designed objective lens enables high resolution imaging at a low acceleration voltage.
- 9.Side entry sample exchange system increases throughput by reducing the time required to change samples and automatically positioning the sample at the current WD.