- 1。The world's highest SE resolution of 0。4 nm at 30 kV is guaranteed。
- 2。Usable magnification of up to 3,000,000x。
- 3.Newly designed CFE GUN provides high brightness and an extremely stable emission current.
- 4。Superior low kV performance for observing beam sensitive materials。
- 5。Next generation Hitachi In-Lens SEM optics allows for routine observation at 1,000,000x。
- 6.Improved vacuum technology that allows for UHV levels for reduced sample contamination.
- 7.Highly engineered instrument enclosure featuring both superior strength and stability to allow for high resolution imaging in a broad range of environmental conditions.
- 8.Newly designed objective lens enables high resolution imaging at a low acceleration voltage.
- 9。Side entry sample exchange system increases throughput by reducing the time required to change samples and automatically positioning the sample at the current WD。